Vence, France

Alain Charles Chiari

This inventor holds 3 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 2007-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alain Charles Chiari. Retrieved from https://idiyas.com/inventor/alain-charles-chiari

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2007-2011

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3 patents (USPTO):Explore Patents

Title: Alain Charles Chiari: Innovator in Signal Synchronization

Introduction

Alain Charles Chiari is a notable inventor based in Vence, France. He has made significant contributions to the field of signal synchronization, holding a total of 3 patents. His work primarily focuses on enhancing the efficiency and accuracy of testing systems.

Latest Patents

Chiari's latest patents include a method and apparatus for synchronizing signals in a testing system. The preferred embodiments of this invention provide innovative approaches for synchronizing signals. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is utilized as a timing reference for other devices.

Career Highlights

Alain Chiari is currently associated with Texas Instruments Corporation, where he continues to develop and refine his inventions. His expertise in signal synchronization has positioned him as a key player in the industry.

Collaborations

Throughout his career, Chiari has collaborated with notable colleagues, including Dale A Heaton and Craig James Lambert. These collaborations have further enriched his work and contributed to advancements in the field.

Conclusion

Alain Charles Chiari's innovative work in signal synchronization has made a lasting impact on testing systems. His patents reflect a commitment to improving technology and enhancing the efficiency of devices under test.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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