The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2009
Filed:
Jun. 13, 2007
Applicants:
Dale a Heaton, Lucas, TX (US);
Craig J Lambert, Plano, TX (US);
Vanessa M Bodrero, Saint-Laurent-du-Var, FR;
Alain C Chiari, Vence, FR;
Inventors:
Dale A Heaton, Lucas, TX (US);
Craig J Lambert, Plano, TX (US);
Vanessa M Bodrero, Saint-Laurent-du-Var, FR;
Alain C Chiari, Vence, FR;
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.