Bengaluru, India

Akshat Ramachandran

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akshat Ramachandran. Retrieved from https://idiyas.com/inventor/akshat-ramachandran

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Akshat Ramachandran: Inventor in Depth-Sensing Technology.

Introduction

Akshat Ramachandran is an inventor based in Bengaluru, India. His patent work concerns combining camera data to determine depth information for objects in a scene.

Latest Patents

The provided information lists one patent for Ramachandran: “Method and Electronic Device for Determining Depth Information of Objects in a Scene.” The invention uses an RGB camera to capture high-resolution images and a depth camera to produce a lower-resolution depth image. It generates an attention map from the RGB images, merges the image data, and evaluates pixel-level uncertainty. Based on an uncertainty threshold, the method determines and applies depth values to pixels to generate a scene with depth information. Ramachandran is credited with 1 patent.

Career Highlights

Ramachandran works at Samsung Electronics Ltd. His listed patent reflects work on image processing and depth estimation, using information from cameras with different pixel densities.

Collaborations

The provided information names Ankit Dhiman and Basavaraja Shanthappa Vandrotti as Ramachandran’s coworkers. Their specific roles in the patent or related work are not specified.

Conclusion

Akshat Ramachandran’s listed invention combines RGB and depth-camera data to estimate scene depth, highlighting his contribution to imaging technology at Samsung Electronics Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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