This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Mitsubishi Materials Corporation. Active years: 2019.
Company Filing History:
Years Active: 2019
Title: Akira Nitta: Innovator in Sampling Technology
Introduction
Akira Nitta is a notable inventor based in Kagawa-gun, Japan. He has made significant contributions to the field of sampling technology, particularly in the area of displaying sampling locations. His innovative approach aims to enhance the accuracy and reliability of sampling methods.
Latest Patents
One of Akira Nitta's key patents is the "Sampling location displaying apparatus and sampling method." This invention involves a method where the coordinate of the sampling location on a specimen is generated randomly by a controller, such as a personal computer. The sampling location is then displayed on the specimen, which consists of recycled raw material, using laser light. This method effectively eliminates the arbitrariness of manually selecting sampling locations, ensuring a more accurate assessment of the average quality of the specimen, including the average content of valuable metals. Akira Nitta holds 1 patent for this innovative technology.
Career Highlights
Akira Nitta is associated with Mitsubishi Materials Corporation, where he continues to develop and refine his inventions. His work has been instrumental in advancing the methodologies used in sampling processes, particularly in industries that require precise measurements of material quality.
Collaborations
Some of Akira Nitta's coworkers include Michiaki Onishi and Kenichi Tomioka, who contribute to the collaborative environment at Mitsubishi Materials Corporation. Their combined expertise fosters innovation and drives the development of new technologies in the field.
Conclusion
Akira Nitta's contributions to sampling technology exemplify the importance of innovation in enhancing industrial processes. His patented methods not only improve accuracy but also promote efficiency in material assessment.