This inventor holds 2 USPTO granted patents. Top assignees: Sumitomo Wiring System, Ltd., Sumitomo Wiring Systems, Limited. Active years: 2002-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2002-2004
Title: Akira Nishino: Innovator in Connector Inspection Technology
Introduction
Akira Nishino is a notable inventor based in Yokkaichi, Japan. He has made significant contributions to the field of connector inspection technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of connector inspections, which are crucial in various electronic applications.
Latest Patents
Nishino's latest patents include a connector inspection apparatus and an electrical connection testing device. The connector inspection apparatus is designed for inspecting connectors that have terminal receiving portions with cavities for terminal insertion. This apparatus features a holder for securing the connector during inspection, an inspection unit, and a lever that facilitates the movement of the inspection unit. The inspection unit can determine the condition of the retainer within the connector, ensuring proper locking. Additionally, the electrical connection testing device is equipped with a connector holder and probe holders that allow for precise testing of terminal fittings within connectors.
Career Highlights
Throughout his career, Akira Nishino has worked with prominent companies such as Sumitomo Wiring System, Ltd. and Sumitomo Wiring Systems, Limited. His experience in these organizations has contributed to his expertise in connector technology and inspection methods.
Collaborations
Nishino has collaborated with talented individuals in his field, including Takao Fujita and Yuji Nagano. These partnerships have likely fostered innovation and the development of advanced technologies in connector inspection.
Conclusion
Akira Nishino's contributions to connector inspection technology through his patents and collaborations highlight his role as an influential inventor in the industry. His work continues to impact the efficiency of electronic component testing and inspection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile