The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2002

Filed:

Jan. 30, 2001
Applicant:
Inventors:

Yuji Nagano, Yokkaichi, JP;

Nobuhiro Suzuki, Yokkaichi, JP;

Akira Nishino, Yokkaichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01H 3/104 ;
U.S. Cl.
CPC ...
H01H 3/104 ;
Abstract

An electrical connection testing device is provided with a connector holder ( ), first and second probe holders ( ) which are successively arranged such that the connector holder ( ) and the second probe holder are movable toward and away from the connector holder ( ). A pushing mechanism ( ) for pushing a receiving surface ( ) of the second probe holder ( ) at the opposite side from the connector holder ( ) is so coupled with the second probe holder ( ) as to be movable toward and away from the second probe holder ( ). The second probe holder ( ) and the connector holder ( ) are moved according to the movement of the pushing mechanism ( ), thereby being positioned at testing positions (P ) where probes ( ) are inserted into testing holes ( ) of a connector (C) from opposite sides or at retracted positions (P ) where the connector can be taken out of a connector holder ( ).


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