This inventor holds 1 USPTO granted patent. Top assignee: Renesas Electronics Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Akira Miyaguchi: Inventor of a Failure Detection Circuit
Introduction
Akira Miyaguchi is an inventor associated with Tokyo, Japan, and Renesas Electronics Corporation. His patent work includes a semiconductor failure detection technology designed to identify circuit failures accurately.
Latest Patents
Miyaguchi is associated with 1 patent: “Failure Detection Circuit, Semiconductor Device and Failure Detection Method.” The invention describes a circuit that compares detection results synchronized with clock signals to identify failures in a target circuit. By comparing these results, the system is designed to improve the accuracy of failure detection.
Career Highlights
Miyaguchi’s listed patent reflects work in semiconductor devices and circuit reliability. The invention focuses on detecting failures in circuits that operate in synchronization with clock signals.
Collaborations
Miyaguchi is associated with Renesas Electronics Corporation. His listed coworker is Daisuke Kawakita.
Conclusion
Akira Miyaguchi’s patent highlights a practical approach to improving failure detection in semiconductor circuits through synchronized signals and comparison logic.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile