The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jul. 16, 2024
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Akira Miyaguchi, Tokyo, JP;

Daisuke Kawakita, Tokyo, JP;

Masaaki Hirano, Tokyo, JP;

Shogo Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); H03K 3/037 (2006.01); H03K 19/20 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31727 (2013.01); G01R 31/31703 (2013.01); H03K 3/037 (2013.01); H03K 19/20 (2013.01);
Abstract

A failure detection circuit is provided in the target circuit having a first circuit area for operating in synchronization with the first clock signal, a first detection circuit for outputting a first detection result obtained by transitioning the voltage level in synchronization with the first clock signal, the first clock signal a second detection circuit for outputting a second detection result obtained by transitioning the voltage level in synchronization with, and a first comparison circuit for outputting a first comparison result by comparing the first detection result and the second detection result. Accordingly, by the failure detection circuit, it is possible to detect the failure accurately.


Find Patent Forward Citations

Miyaguchi, Akira. (2026). Failure detection circuit, semiconductor device and failure detection method (U.S. Patent No. 12761276). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761276

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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