This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Aisin Seiki Kabushiki Kaisha. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Akira Kozakai: Innovator in Inspection Technology
Introduction
Akira Kozakai is a notable inventor based in Kariya, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work is characterized by a focus on enhancing the accuracy and efficiency of inspection processes.
Latest Patents
Kozakai holds a patent for an "Inspection device, storage medium, and program." This device includes an irradiation unit that emits light onto an inspection target, a captured image acquisition unit that captures images of the target, and a calculation unit that determines coordinates on a display screen based on the captured images. Additionally, the inspection pattern creation unit generates patterns displayed on the screen to identify defects on the surface of the inspection target. This invention showcases Kozakai's commitment to advancing inspection methodologies.
Career Highlights
Kozakai is currently employed at Aisin Seiki Kabushiki Kaisha, a leading company in the automotive parts industry. His role involves developing innovative solutions that improve product quality and reliability. His dedication to research and development has positioned him as a key player in his field.
Collaborations
Throughout his career, Kozakai has collaborated with talented individuals such as Munehiro Takayama and Masataka Toda. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.
Conclusion
Akira Kozakai's contributions to inspection technology exemplify the impact of innovation in enhancing product quality. His patent and collaborative efforts reflect a commitment to excellence in his field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
