The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2019
Filed:
Mar. 29, 2017
Aisin Seiki Kabushiki Kaisha, Kariya-shi, JP;
Munehiro Takayama, Kariya, JP;
Akira Kozakai, Kariya, JP;
Masataka Toda, Toyohashi, JP;
Yukio Ichikawa, Ichinomiya, JP;
AISIN SEIKI KABUSHIKI KAISHA, Kariya-shi, JP;
Abstract
An inspection device includes: an irradiation unit irradiating an inspection target with light by causing a predetermined position within a display screen to emit light; a captured image acquisition unit acquiring a captured image obtained by imaging the inspection target; a calculation unit calculating coordinates in the display screen corresponding to coordinates in the captured image on the basis of light emission position coordinate information and light reception position coordinate information indicating coordinates of a light emission position and a light reception position; and an inspection pattern creation unit creating an inspection pattern which is displayed on the display screen so that first patterns and second patterns are alternately arranged in the captured image and which is used to inspect presence a defect on a surface of the inspection target, on the basis of a calculation result of the calculation unit.