Niigata, Japan

Akira Kosugi

This inventor holds 1 USPTO granted patent. Top assignee: Shin-Etsu Handotai Co., Ltd.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Kosugi. Retrieved from https://idiyas.com/inventor/akira-kosugi-gdn6fq6t

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Akira Kosugi: Innovator in Silicon Wafer Analysis

Introduction

Akira Kosugi is a notable inventor based in Niigata-ken, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the analysis of silicon wafers. His work has implications for the quality and efficiency of semiconductor manufacturing.

Latest Patents

Kosugi holds a patent for a "Method for analyzing impurities within silicon wafer." This innovation addresses critical challenges in ensuring the purity of silicon wafers, which is essential for the performance of electronic devices.

Career Highlights

He is currently employed at Shin-Etsu Handotai Co., Ltd., a leading company in the semiconductor industry. His role involves research and development, focusing on improving the quality of silicon materials used in various applications.

Collaborations

Throughout his career, Kosugi has collaborated with talented individuals such as Yutaka Ohta and Hirofumi Nishijo. These partnerships have fostered innovation and have contributed to advancements in semiconductor technology.

Conclusion

Akira Kosugi's work in analyzing impurities in silicon wafers showcases his commitment to enhancing semiconductor manufacturing processes. His contributions are vital for the ongoing development of high-quality electronic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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