Location History:
- Hitachinaka, JP (2011 - 2012)
- Tokyo, JP (2020)
Company Filing History:
Years Active: 2011-2020
Title: Akira Karakama: Innovator in Charged Particle Beam Technology
Introduction
Akira Karakama is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 3 patents. His work focuses on improving the efficiency and reliability of charged particle beam devices.
Latest Patents
Karakama's latest patents include a "Charged Particle Beam Device and Control Method of Charged Particle Beam Device." This invention enhances traceability of stage movement and tolerance to communication failure by switching between multiple image transfer units based on the state of the stage. The first image transfer protocol offers higher reliability compared to a second protocol, which allows for faster transfer speeds when the stage is in motion.
Another significant patent is the "Charged Particle Beam Apparatus and Image Generation Method with Charged Particle Beam Apparatus." This invention aims to optimize scanning according to specific circumstances, thereby reducing image distortion and improving throughput, image quality, and defect detection rates. The apparatus is designed to detect abnormal conditions of an inspection target by utilizing a charged particle beam and detecting generated secondary electrons.
Career Highlights
Karakama is currently employed at Hitachi High-Technologies Corporation, where he continues to innovate in the field of charged particle beam technology. His work has been instrumental in advancing the capabilities of inspection apparatuses used in various industries.
Collaborations
Throughout his career, Karakama has collaborated with talented individuals such as Hidemitsu Naya and Takuya Shirato. These collaborations have contributed to the development of cutting-edge technologies in his field.
Conclusion
Akira Karakama's contributions to charged particle beam technology exemplify the impact of innovative thinking in engineering. His patents reflect a commitment to enhancing the performance and reliability of advanced inspection systems.