This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1989.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1989
Title: Akira Hoshika: Innovator in Measurement Technology
Introduction
Akira Hoshika is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. Hoshika's work focuses on improving the accuracy of measurement systems, which is crucial in various applications.
Latest Patents
Hoshika holds a patent for a "Method and apparatus for measuring settling characteristics of a device." This invention provides a systematic approach to measuring the settling characteristics of devices under test. The method employs a measurement system that samples and digitizes input signals to obtain reference data. By measuring a reference signal with a flat level, Hoshika's system can effectively remove error components from the measurement data, ensuring more accurate results.
Career Highlights
Hoshika is currently associated with Hewlett-Packard Company, where he continues to develop and refine measurement technologies. His expertise in this area has positioned him as a valuable asset to his team and the broader field of engineering.
Collaborations
Hoshika has worked alongside talented colleagues, including Toshio Tamamura and Kiyoyasu Hiwada. Their collaborative efforts have contributed to advancements in measurement techniques and technologies.
Conclusion
Akira Hoshika's innovative work in measurement technology exemplifies the importance of precision in engineering. His patent and contributions to Hewlett-Packard Company highlight his role as a leading inventor in this field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
