Akira Hatano

Title: Akira Hatano: Innovator in Mobile Terminal Technology

Introduction

Akira Hatano is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of mobile technology, particularly through his innovative patent related to mobile terminal testing.

Latest Patents

Hatano holds a patent for a "Mobile terminal test device and method." This invention involves the combination of downlink signals output from a transmission and reception unit with an interference signal of a continuous wave (CW). The resultant signal is applied to a mobile terminal, allowing for the collective measurement of throughputs for respective interference signal frequencies. The invention also includes a method for fitting a signal suppression band of the filter to a frequency band of the downlink signal, ensuring that it meets defined values. This process allows for re-measurement and re-determination of the throughput for the downlink signal, enhancing the efficiency of mobile terminal testing.

Career Highlights

Akira Hatano is currently employed at Anritsu Corporation, where he continues to develop and refine technologies in mobile communications. His work has been instrumental in advancing the capabilities of mobile terminal testing devices.

Collaborations

Hatano collaborates with talented colleagues, including Ryota Chinbe and Nobutoshi Otonari, who contribute to the innovative environment at Anritsu Corporation.

Conclusion

Akira Hatano's contributions to mobile technology through his patent and work at Anritsu Corporation highlight his role as a key innovator in the field. His advancements in mobile terminal testing are paving the way for improved communication technologies.