Tokyo, Japan

Akinori Kiyokawa

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Hitachi High-Tech Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akinori Kiyokawa. Retrieved from https://idiyas.com/inventor/akinori-kiyokawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Akinori Kiyokawa: Innovator in Automatic Analysis Devices

Introduction

Akinori Kiyokawa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of automatic analysis devices, showcasing his expertise through innovative designs and patents.

Latest Patents

Kiyokawa holds a patent for an automatic analysis device. This device features a structure that minimizes susceptibility to disturbances compared to existing devices. The design includes a first rotation axis of a reaction disk, a second rotation axis of a reagent disk, and a measurement unit arranged in a straight line when viewed from above. The arrangement allows for improved accessibility for users.

Career Highlights

Kiyokawa is associated with Hitachi High-Tech Corporation, where he has been instrumental in advancing technology in automatic analysis. His work has been recognized for its practical applications in various fields.

Collaborations

Some of Kiyokawa's coworkers include Akihiro Yasui and Takeshi Setomaru. Their collaborative efforts contribute to the innovative environment at Hitachi High-Tech Corporation.

Conclusion

Akinori Kiyokawa's contributions to automatic analysis devices highlight his role as a key inventor in the field. His innovative designs continue to influence technology and improve user experience.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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