The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Mar. 05, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Akihiro Yasui, Tokyo, JP;
Takeshi Setomaru, Tokyo, JP;
Akinori Kiyokawa, Tokyo, JP;
Masashi Fukaya, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
There is provided an automatic analysis device with a structure in which a measurement unit is less susceptible to disturbance as compared to a device in the related art, and a method of designing the automatic analysis device. A first rotation axisof a reaction disk, a second rotation axisof a reagent disk, and a measurement unit are arranged on the same straight linewhen an automatic analysis deviceis viewed from an upper surface side, the first rotation axisof the reaction diskis arranged between the second rotation axisof the reagent diskand the measurement unit, and the measurement unit is arranged on a front side to be accessed by a user of the automatic analysis device