Osaka, Japan

Akihiro Shin


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021-2022

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4 patents (USPTO):Explore Patents

Title: The Innovative Mind of Akihiro Shin

Introduction

Akihiro Shin is an accomplished inventor based in Osaka, Japan, known for his contributions to the field of flaw detection technology. With a remarkable portfolio of four patents, Shin has shown a dedicated commitment to advancing the capabilities of nondestructive testing methods.

Latest Patents

Akihiro Shin's latest inventions focus on eddy current flaw detection devices. His first patent presents an eddy current flaw detection device capable of applying a sufficiently strong magnetic field to a test object without relying on an excessively large magnet. This device features a magnetic-field forming magnet that includes both a base magnet piece and a tip magnet piece. Notably, the tip magnet piece has a tip pole face that directs a magnetic pole towards the test object, with a smaller area than the base face of the base magnet piece.

Shin's second patent elaborates on an eddy current flaw detection device and method that effectively removes noise from detection signals. This innovation involves applying a magnetic field to a test object through a magnetic-field forming magnet, with the magnetic flux density adjusted based on the distance to the detection surface and the test object's thickness.

Career Highlights

Throughout his career, Akihiro Shin has worked with several notable companies, including Hitachi Zosen Corporation and Nihon Densokuki Co., Ltd. His experience at these organizations has undoubtedly contributed to the depth of his knowledge and expertise in the technology sector, particularly in the realm of flaw detection.

Collaborations

Shin's journey in innovation has also seen him collaborate with talented individuals such as Hiroaki Arai and Takaaki Yamada. These partnerships have opened up avenues for creative problem-solving and the exchange of ideas within the field of engineering.

Conclusion

In summary, Akihiro Shin stands out as a key figure in the evolution of eddy current flaw detection technology. His inventions not only illustrate a significant understanding of magnetic fields but also aim to enhance the reliability and efficiency of flaw detection processes. As innovations continue to evolve, Shin's contributions will likely play an instrumental role in the advancement of this vital industry.

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