The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
May. 22, 2018
Applicants:
Hitachi Zosen Corporation, Osaka, JP;
Nihon Densokuki Co., Ltd., Fukuoka, JP;
Inventors:
Hiroaki Arai, Osaka, JP;
Akihiro Shin, Osaka, JP;
Takaaki Yamada, Kitakyushu, JP;
Hiroshi Azuma, Kitakyushu, JP;
Assignees:
Hitachi Zosen Corporation, Osaka, JP;
Nihon Densokuki Co., Ltd., Fukuoka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2021.01);
U.S. Cl.
CPC ...
G01N 27/9006 (2013.01);
Abstract
The present invention provides an eddy current flaw detection device that sufficiently removes noise from a detection signal. A magnetic field is applied to a test object by a magnetic-field forming magnet. The magnetic flux density of a magnetic field generated by the magnetic-field forming magnet is set at a value in a predetermined range according to a distance between the magnetic-field forming magnet and a detection surface and the thickness of the test object.