The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
May. 21, 2018
Applicant:
Hitachi Zosen Corporation, Osaka, JP;
Inventors:
Hiroaki Arai, Osaka, JP;
Akihiro Shin, Osaka, JP;
Takaaki Yamada, Fukuoka, JP;
Hiroshi Azuma, Fukuoka, JP;
Assignee:
HITACHI ZOSEN CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/9013 (2021.01); G01N 27/90 (2021.01);
U.S. Cl.
CPC ...
G01N 27/902 (2013.01); G01N 27/9046 (2013.01);
Abstract
The present invention provides an eddy current flaw detection device capable of applying a sufficiently strong magnetic field to a test object without using a significantly large magnet. A magnetic-field forming magnetincludes a base magnet pieceand a tip magnet piece. The tip magnet piecehas a tip pole facefrom which a magnetic pole is directed toward a test object. The tip pole facehas a smaller area than a base faceof the base magnet piece, the base facebeing located on the opposite side of the magnetic-field forming magnetfrom the tip pole face