Kanagawa-ken, Japan

Akihiro Mishima


Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 17(Granted Patents)


Location History:

  • Yokohama, JP (2000)
  • Kanagawa-ken, JP (2003)

Company Filing History:


Years Active: 2000-2003

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2 patents (USPTO):Explore Patents

Title: Akihiro Mishima: Innovator in Semiconductor Memory Technology

Introduction

Akihiro Mishima is a prominent inventor based in Kanagawa-ken, Japan. He has made significant contributions to the field of semiconductor memory devices, holding a total of 2 patents. His work focuses on improving the reliability and efficiency of memory technology.

Latest Patents

Mishima's latest patents include a semiconductor memory device implemented with a test circuit. This innovative device is designed to easily detect the location of defective bit lines and memory cells by utilizing a leakage current path for a short time. The device determines regions flowing a leakage current by selecting predetermined column selection lines, allowing for efficient identification of defects. Another notable patent is a semiconductor memory device and method that relieves defects in semiconductors. This device features a complex arrangement of bit lines, word lines, and MOS transistors, along with redundancy circuits that replace defective cells, ensuring enhanced performance and reliability.

Career Highlights

Mishima is associated with Kabushiki Kaisha Toshiba, a leading company in the technology sector. His work at Toshiba has been instrumental in advancing semiconductor technology, contributing to the company's reputation for innovation and quality.

Collaborations

Mishima has collaborated with notable coworkers, including Yoichi Suzuki and Yasumitsu Nozawa. Their combined expertise has fostered a productive environment for innovation in semiconductor technology.

Conclusion

Akihiro Mishima's contributions to semiconductor memory technology exemplify his dedication to innovation. His patents reflect a commitment to enhancing the functionality and reliability of memory devices, making a lasting impact in the field.

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