Toki, Japan

Akihiko Niwa

This inventor holds 20 USPTO granted patents and 3 EPO patents, primarily in Printing Technology. Top assignee: Brother Kogyo Kabushiki-Kaisha. Active years: 1994-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akihiko Niwa. Retrieved from https://idiyas.com/inventor/akihiko-niwa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 90.0

 

Average Co-Inventor Count = 2.7

ph-index = 9

Forward Citations = 220(Granted Patents)


Location History:

  • Nagoya, JP (1995 - 2000)
  • Toki, JP (1994 - 2014)

Company Filing History:


Years Active: 1994-2014

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Areas of Expertise:
Printing Apparatus
RFID Tag
Tape Printer
Label Production
Document Processing
Bar Code Printing
Color Range Setting
Manual Tape Cutting
Character Sizing
Print Format Control
Two-Dimensional Code
Tangible Medium
20 patents (USPTO):Explore Patents

Title: Akihiko Niwa: Pioneering Inventor from Toki, Japan

Introduction: Akihiko Niwa is a renowned inventor hailing from Toki, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Akihiko Niwa holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Akihiko Niwa has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Akihiko Niwa has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Akihiko Niwa's passion for innovation, coupled with his relentless drive to push the boundaries of technology, has solidified his reputation as a trailblazing inventor in Toki, Japan, and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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