Akihiko Honma

Title: Akihiko Honma: Innovator in Scanning Probe Microscopy

Introduction

Akihiko Honma is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of microscopy, particularly through his innovative designs and patents. With a total of six patents to his name, Honma has established himself as a key figure in advancing technology in this area.

Latest Patents

One of Honma's latest patents is a scanning probe microscope that is designed to confirm whether a sample shape meets specified conditions. This innovative microscope utilizes a pseudo reference image that consists of a pair of reference line profiles arranged in parallel. The operator can move and rotate this pseudo reference image on a screen to ensure that the sample shape line profile fits between the reference line profiles. If the sample shape fits within these profiles, it is determined to be in specification. Conversely, if it does not fit, it is deemed out of specification, regardless of how the pseudo reference image is adjusted.

Career Highlights

Throughout his career, Akihiko Honma has worked with prominent companies such as Seiko Instruments Inc. and Sii Nanotechnology Inc. His work in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in microscopy technology.

Collaborations

Honma has collaborated with notable individuals in his field, including Kazutoshi Watanabe and Ryuichi Matsuzaki. These collaborations have further enhanced his work and have led to significant developments in the technology he specializes in.

Conclusion

Akihiko Honma's contributions to the field of scanning probe microscopy demonstrate his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving the accuracy and efficiency of sample analysis, making him a significant figure in the world of invention.