Afroz J Zaman

Title: Afroz J Zaman: Innovator in Antenna Technology

Introduction

Afroz J Zaman is a notable inventor based in Strongsville, OH (US). She has made significant contributions to the field of antenna technology, particularly through her innovative patent. Her work focuses on enhancing the characterization of antenna systems, which is crucial for various applications in telecommunications and beyond.

Latest Patents

Afroz J Zaman holds a patent for an "Antenna near-field probe station scanner." This miniaturized antenna system is characterized non-destructively using a scanner that measures its near-field radiated power performance. The scanner can be moved linearly along the x, y, and z axes, as well as rotationally relative to the antenna. The data obtained from this characterization is processed to determine the far-field properties of the system and optimize its performance. Each antenna is excited using a probe station system while a scanning probe measures the near-field signals above the antenna. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. This system also allows for extensive graphing and analysis of both near-field and far-field data.

Career Highlights

Afroz J Zaman is currently associated with the United States of America as represented by the Administrator of NASA. Her work has been instrumental in advancing antenna technology, and she has demonstrated a commitment to innovation in her field.

Collaborations

Afroz has collaborated with notable colleagues, including Richard Lee and William G Darby. These collaborations have further enriched her research and development efforts in antenna systems.

Conclusion

Afroz J Zaman is a pioneering inventor whose work in antenna technology has the potential to impact various industries. Her innovative approaches and dedication to research exemplify the spirit of invention and progress in the field.