The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Aug. 02, 2006
Afroz J. Zaman, Strongsville, OH (US);
Richard Q. Lee, Ann Arbor, MI (US);
William G. Darby, Litchfield, OH (US);
Philip J. Barr, Schiller Park, IL (US);
Kevin M Lambert, North Royalton, OH (US);
Felix A. Miranda, Olmsted Falls, OH (US);
Afroz J. Zaman, Strongsville, OH (US);
Richard Q. Lee, Ann Arbor, MI (US);
William G. Darby, Litchfield, OH (US);
Philip J. Barr, Schiller Park, IL (US);
Kevin M Lambert, North Royalton, OH (US);
Felix A. Miranda, Olmsted Falls, OH (US);
Abstract
A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.