Adrianus Van De Goor

Title: The Innovative Mind of Adrianus Van De Goor

Introduction

Adrianus Van De Goor is a notable inventor based in Gouda, Netherlands. He has made significant contributions to the field of memory testing through his innovative patent. His work is characterized by a focus on efficiency and flexibility in memory testing methodologies.

Latest Patents

Adrianus holds a patent for a "Generic march element based memory built-in self test." This invention outlines a method for testing a memory under test, which includes a plurality of memory cells and a Memory Built-In Self-Test Engine (MBIST) that is connectable to the memory under test. The MBIST engine is designed to generate appropriate addressing and read and/or write operations to the memory under test. It is connected to a March Element Stress register (MESR), a generic march element register (GMER), and a Command Memory. The GMER specifies one of a set of Generic March Elements (GME), while the MESR specifies the stress conditions to be applied. This architecture is both orthogonal and modular, requiring only minimal memory for test specification, which results in low implementation costs and high flexibility.

Career Highlights

Adrianus Van De Goor is affiliated with Technische Universiteit Delft, where he continues to advance his research and innovations in memory testing technologies. His work has garnered attention for its practical applications in the industry.

Collaborations

Adrianus has collaborated with esteemed colleagues such as Said Hamdioui and Zaid Al-Ars, contributing to the advancement of memory testing methodologies.

Conclusion

Adrianus Van De Goor's innovative approach to memory testing exemplifies the importance of flexibility and efficiency in technological advancements. His contributions continue to influence the field significantly.