This inventor holds 3 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Phenom-World Holding B.v., Fei Comapny. Active years: 2020-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020-2021
Title: The Innovations of Adrianus Franciscus Johannes Hammen
Introduction
Adrianus Franciscus Johannes Hammen is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of microscopy, particularly with his advancements in scanning electron microscopes. With a total of 3 patents, Hammen's work has had a considerable impact on the technology used in scientific research.
Latest Patents
Hammen's latest patents include innovative designs for scanning electron microscopes. One of his notable inventions features a sliding vacuum seal between the electron optical imaging system and the sample carrier. This design includes a first plate with an aperture associated with the imaging system, resting against a second plate with an aperture linked to the sample carrier. The plates are designed with grooves that circumscribe the apertures, enhancing the functionality of the microscope. Additionally, the invention incorporates a movable detector relative to the electron beam and a motion control unit that allows the sample carrier to move along a collision-free path.
Career Highlights
Throughout his career, Hammen has worked with prominent companies in the field of microscopy. He has been associated with Phenom-World Holding B.V. and FEI Company, where he has contributed to the development of advanced imaging technologies. His expertise in electron microscopy has positioned him as a key figure in the industry.
Collaborations
Hammen has collaborated with several professionals in his field, including Karel D Van Der Mast and Sander Richard Marie Stoks. These collaborations have further enriched his work and contributed to the advancements in microscopy technology.
Conclusion
Adrianus Franciscus Johannes Hammen's contributions to the field of microscopy through his patents and collaborations highlight his innovative spirit and dedication to advancing scientific research. His work continues to influence the development of scanning electron microscopes, making significant strides in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile