Adi Boehm

Title: Adi Boehm: Innovator in Semiconductor Inspection Technologies

Introduction

Adi Boehm is a prominent inventor based in Ramat Gan, Israel. She has made significant contributions to the field of semiconductor inspection technologies, holding a total of four patents. Her innovative work focuses on methods for identifying and analyzing defects in semiconductor materials.

Latest Patents

Adi Boehm's latest patents include a groundbreaking process for monitoring defects in materials. This method involves acquiring an electromagnetic emission spectrum of a defect using a charged particle beam system. Additionally, it includes obtaining a backscattered electron (BSE) image to determine the defect material element. The process also addresses ambiguities in the emission spectrum by resolving them based on the BSE image. Another notable patent is a method of inspecting a specimen, which involves generating a die layout clip based on location information of potential defects. This clip is then used by semiconductor inspection units to analyze wafers effectively.

Career Highlights

Adi Boehm works at Applied Materials Israel Limited, a leading company in the semiconductor industry. Her role involves developing advanced inspection technologies that enhance the reliability and efficiency of semiconductor manufacturing processes.

Collaborations

Adi collaborates with talented coworkers, including Zvi Goren and Amit Batikoff. Their combined expertise contributes to the innovative projects at Applied Materials Israel Limited.

Conclusion

Adi Boehm's contributions to semiconductor inspection technologies demonstrate her commitment to innovation and excellence in her field. Her patents reflect a deep understanding of material science and engineering, positioning her as a key figure in advancing semiconductor technology.