San Francisco, CA, United States of America

Adam Kleczewski


 

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2016-2018

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6 patents (USPTO):Explore Patents

Title: Adam Kleczewski: Innovator in Optical Measurement Technologies

Introduction

Adam Kleczewski is a prominent inventor based in San Francisco, CA. He has made significant contributions to the field of optical measurement technologies, holding a total of 6 patents. His work focuses on enhancing the capabilities of pulsed lasers and infrared imaging systems.

Latest Patents

Kleczewski's latest patents include innovative methods for noise reduction in pulsed lasers and advancements in infrared imaging systems. One of his notable patents, titled "Noise reduction for pulsed lasers using clustering," describes an optical measurement method that generates a series of light pulses using a pulsed laser. This method allows for the detection and sorting of pulse data sets based on correlation coefficients, enabling independent processing of data from different mode hop sequences. Another significant patent, "Infrared imaging system with automatic referencing," outlines a method for obtaining reference samples during mid-infrared imaging without removing the specimen. This system utilizes a tunable MIR laser and a sophisticated optical assembly to maintain a fixed distance between the focusing lens and the specimen stage, enhancing the accuracy of the imaging process.

Career Highlights

Kleczewski is currently employed at Agilent Technologies, Inc., where he continues to develop cutting-edge technologies in optical measurement. His work has positioned him as a key figure in the advancement of laser and imaging technologies.

Collaborations

Throughout his career, Kleczewski has collaborated with talented individuals such as Miao Zhu and Richard Paul Tella. These collaborations have contributed to the successful development of his innovative patents.

Conclusion

Adam Kleczewski's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of complex systems and a drive to improve measurement techniques in various applications.

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