Portland, OR, United States of America

Aaron W Rosenbaum

This inventor holds 2 USPTO granted patents. Top assignee: Intel Corporation. Active years: 2015-2016.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2015-2016

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2 patents (USPTO):Explore Patents

Title: Innovations of Aaron W. Rosenbaum

Introduction

Aaron W. Rosenbaum is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of microelectronics, particularly in the fabrication of transistors. With a total of 2 patents to his name, his work has had a considerable impact on the development of advanced microelectronic devices.

Latest Patents

Rosenbaum's latest patents focus on capping dielectric structures for transistor gates. The first patent describes the formation of a recessed gate electrode capped by a substantially void-free dielectric capping structure. This structure can be formed using a high-density plasma process, which enhances the performance of microelectronic transistors, including non-planar transistors. The second patent is similar in nature, emphasizing the importance of dielectric capping structures in the fabrication of microelectronic devices.

Career Highlights

Aaron W. Rosenbaum is currently employed at Intel Corporation, where he continues to innovate in the field of microelectronics. His work at Intel has allowed him to collaborate with other talented professionals in the industry, further advancing the technology behind microelectronic devices.

Collaborations

Some of his notable coworkers include Din-How Mei and Sameer S. Pradhan. Their collaborative efforts contribute to the ongoing advancements in microelectronic technology.

Conclusion

Aaron W. Rosenbaum's contributions to the field of microelectronics through his patents and work at Intel Corporation highlight his role as an influential inventor. His innovations in transistor fabrication are paving the way for future developments in microelectronic devices.

Profile summary based on public USPTO records.
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