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Tucson, AZ, United States of America

Zetetic Institute

USPTO Granted Patents = 40

Forward Citations = 982

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4 inventors (with patents filed for the assignee):

Henry Allen Hill (39 out of 145 patents)

Gary L Womack (1 out of 1 patent)

Douglas A Ziebell (1 out of 1 patent)

4. Paul H Oglesby (1 out of 1 patent)

Core Competencies:

Optical Interferometry

Catoptric Imaging Systems

Confocal Microscopy

Lithography Metrology

Wavefront Measurement

Spatial Impulse Response

Atmospheric Turbulence Compensation

High Spatial Resolution

Sub-Wavelength Defect Detection

Multiple-Source Arrays

Adaptive Optical Systems

Near-Field Microscopy

40 patents: Sort by Forward Citations

1. 7646490 - Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase shifting point-diffraction interferometry (2010-01-12),

2. 7508527 - Apparatus and method of in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry (2009-03-24),

3. 7495769 - Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry (2009-02-24),

4. 7460245 - Apparatus and method for measurement and compensation of atmospheric turbulence effects in wavefront interferometry (2008-12-02),

5. 7428058 - Apparatus and method for in situ and ex situ measurements of optical system flare (2008-09-23),

6. 7405832 - Apparatus and methods for reduction and compensation of effects of vibrations and of environmental effects in wavefront interferometry (2008-07-29),

7. 7355722 - Catoptric and catadioptric imaging systems with adaptive catoptric surfaces (2008-04-08),

8. 7345771 - Apparatus and method for measurement of critical dimensions of features and detection of defects in UV, VUV, and EUV lithography masks (2008-03-18),

9. 7324216 - Sub-nanometer overlay, critical dimension, and lithography tool projection optic metrology systems based on measurement of exposure induced changes in photoresist on wafers (2008-01-29),

10. 7324209 - Apparatus and method for ellipsometric measurements with high spatial resolution (2008-01-29),

11. 7312877 - Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy (2007-12-25),

12. 7298496 - Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry (2007-11-20),

13. 7263259 - Multiple-source arrays fed by guided-wave structures and resonant guided-wave structure cavities (2007-08-28),

14. 7180604 - Catoptric and catadioptric imaging systems with pellicle and aperture-array beam-splitters and non-adaptive and adaptive catoptric surfaces (2007-02-20),

15. 7164480 - Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy (2007-01-16),

Zetetic Institute is a leading research organization specializing in cutting-edge scientific advancements. With a diverse team of experts in various fields, we are committed to pushing the boundaries of knowledge and driving innovation. Our research areas encompass quantum physics, artificial intelligence, biotechnology, and renewable energy. Through our interdisciplinary approach, we aim to create practical solutions that enhance the quality of life for individuals and contribute to societal progress.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

40 Patents

#14 in Tucson, AZ

#104 in Arizona

#8,349 in US

#16,565 in the World

Tucson, AZ, United States of America

Zetetic Institute

Forward Citations = 982

4 inventors:

Henry Allen Hill (39 out of 145 patents)

Gary L Womack (1 out of 1 patent)

Douglas A Ziebell (1 out of 1 patent)

4. Paul H Oglesby (1 out of 1 patent)

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