The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Aug. 24, 2006
Henry A. Hill, Tucson, AZ (US);
Henry A. Hill, Tucson, AZ (US);
Zetetic Institute, Tucson, AZ (US);
Abstract
A method of operating a wavefront interferometry system that generates an array of interference signals that contains information about relative wavefronts of measurement and reference beams, the method involving: from the array of interference signals, computing a first array of phase measurements for a first time and a second array of phase measurements for a second time; computing a difference of the first and second arrays of phase measurements to determine an array of rates of phase changes; and from the array of rates of phase changes, computing an array of atmospheric turbulence effect values which is a measure of atmospheric turbulence effects in the wavefront interferometry system.