Valmet-Tampella Oy

Calculating rank

USPTO Granted Patents = 5

CIPO Patents = 1

Forward Citations = 22

Loading Chart...

7 inventors (with patents filed for the assignee):

Paavo Rautakorpi (3 out of 11 patents)

Seppo Haavisto (3 out of 4 patents)

Jukka A Lehtinen (3 out of 20 patents)

4. Jari Ilomaki (1 out of 2 patents)

5. Mayri O Sundstrom (1 out of 1 patent)

6. Heikki J Seppa (1 out of 1 patent)

7. Timo T Varpula (1 out of 1 patent)

8. Jouko Hautala (25 patents)

5 patents: Sort by Forward Citations

1. 5604995 - Wire seal for a drying space in a drying apparatus (1997-02-25),

2. 5594996 - Apparatus for drying a fibre web (1997-01-21),

3. 5566472 - Seal for use at band edges in a drying space of a drying apparatus (1996-10-22),

4. 5530346 - Method and apparatus for determining the size and shape of a slot by (1996-06-25),

5. 5471765 - Arrangement in a dryer for a fibre web (1995-12-05),

Company Overview

Valmet-Tampella Oy is a leading global developer and supplier of technologies, automation, and services for the pulp, paper, and energy industries. The company specializes in offering solutions for sustainable production and resource efficiency. With a strong focus on research and development, Valmet-Tampella Oy is committed to driving innovation and driving the industry forward.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

5 Patents

#42 in Tampere

#534 in Finland

Tampere, Finland

Valmet-Tampella Oy

Forward Citations = 22

7 inventors:

Paavo Rautakorpi (3 out of 11 patents)

Seppo Haavisto (3 out of 4 patents)

Jukka A Lehtinen (3 out of 20 patents)

4. Jari Ilomaki (1 out of 2 patents)

5. Mayri O Sundstrom (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Valmet-Tampella Oy. Retrieved from https://idiyas.com/company/valmet-tampella-oy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]