For the Inventor, By the Inventor

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Singapore, Singapore

Umci Ltd

USPTO Granted Patents = 2

Forward Citations = 59

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4 inventors (with patents filed for the assignee):

Henry Huang (1 out of 2 patents)

Meisheng Zhou (1 out of 9 patents)

Hong Ma (1 out of 13 patents)

4. YongSeng Tan (1 out of 1 patent)

2 patents: Sort by Forward Citations

1. 7402801 - Inspecting method of a defect inspection device (2008-07-22),

2. 7142940 - Method of processing semiconductor wafer (2006-11-28),

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USPTO Data Jan 1 1976 - Dec 23 2025

2 Patents

#566 in Singapore

#567 in Singapore

Singapore, Singapore

Umci Ltd

Forward Citations = 59

4 inventors:

Henry Huang (1 out of 2 patents)

Meisheng Zhou (1 out of 9 patents)

Hong Ma (1 out of 13 patents)

4. YongSeng Tan (1 out of 1 patent)

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