Hsinchu, Taiwan

YongSeng Tan


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 57(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: YongSeng Tan: Innovator in Defect Inspection Technology

Introduction

YongSeng Tan, an accomplished inventor based in Hsinchu, Taiwan, has contributed significantly to the field of defect inspection technology. With a focus on enhancing the reliability and precision of inspection devices, he holds one notable patent that showcases his innovative approach.

Latest Patents

YongSeng Tan's patent, titled "Inspecting method of a defect inspection device," outlines a comprehensive method for detecting defects on a wafer. This innovative process involves forming multiple defect inspection devices on the wafer, which consist of an insulating layer topped by a conductive layer. By setting specific defect inspection parameters and employing electron beam scanning, the method allows for detailed monitoring of defect signals. If the number of defect signals detected is less than the number of inspection devices, adjustments are made to the parameters, and the scanning process is repeated until the signals align with the expected counts. This meticulous approach ensures accurate defect detection and enhances the efficiency of semiconductor manufacturing processes.

Career Highlights

YongSeng Tan is currently associated with Umci Ltd., where he continues to push the boundaries of technology within his domain. His work has not only defined his career but has also provided substantial advancements in defect inspection methodologies.

Collaborations

At Umci Ltd., YongSeng collaborates with a talented team, including his coworker, Henry Huang. Their collective efforts contribute to the ongoing development of innovative inspection techniques that aim to improve the accuracy and efficiency of defect detection in the semiconductor industry.

Conclusion

In conclusion, YongSeng Tan's contributions to defect inspection technology are marked by his innovative patent and collaborative efforts at Umci Ltd. His dedication to improving accuracy in semiconductor manufacturing positions him as a prominent figure in the field, driving forward the technologies that impact the industry.

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