EPO Patents = 1

Trademarks = 2

Forward Citations = 0

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2 inventors (with patents filed for the assignee):

Arkadij M Elizarov (5 out of 19 patents)

Artem Y Lebedev (5 out of 8 patents)

5 patents: Sort by Forward Citations

1. 12007376 - Method for determining a concentration of a synthesis component in a radiopharmaceutical sample (2024-06-11),

2. 11846621 - Method of determining radiation characteristic of a sample (2023-12-19),

3. 11002717 - Systems and methods for characterizing radioactive analytes (2021-05-11),

4. 10895563 - Palette-based systems for analyte characterization (2021-01-19),

5. 10309947 - System and method for radiosynthesis, quality control and dose dispensing (2019-06-04),

Company Overview

Trace-ability, Inc. is a leading provider of software solutions for supply chain traceability and transparency. Our innovative technology allows companies to track and trace products throughout the supply chain, ensuring quality control and compliance with regulations. With our user-friendly platform, businesses can easily monitor their products from source to shelf, improving efficiency and reducing risks. Trust Trace-ability, Inc. for seamless traceability solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

5 Patents

#28 in Van Nuys, CA

#12,073 in California

#51,644 in US

Van Nuys, CA, United States of America

Trace-Ability, Inc.

Forward Citations = 0

2 inventors:

Arkadij M Elizarov (5 out of 19 patents)

Artem Y Lebedev (5 out of 8 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Trace-Ability, Inc.. Retrieved from https://idiyas.com/company/trace-ability

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]