The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Dec. 15, 2020
Applicant:
Trace-ability, Inc., Van Nuys, CA (US);
Inventors:
Artem Y. Lebedev, Santa Monica, CA (US);
Arkadij M. Elizarov, Woodland Hills, CA (US);
Assignee:
Trace-Ability, Inc., Van Nuys, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/15 (2006.01); C12M 1/34 (2006.01); C12Q 1/02 (2006.01); G01N 21/78 (2006.01); G01N 21/82 (2006.01); A61B 6/03 (2006.01); G01N 21/25 (2006.01); G01N 21/51 (2006.01); G01N 21/75 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/15 (2013.01); C12M 41/36 (2013.01); C12Q 1/02 (2013.01); G01N 21/78 (2013.01); G01N 21/82 (2013.01); A61B 6/037 (2013.01); G01N 21/253 (2013.01); G01N 21/51 (2013.01); G01N 2021/752 (2013.01); G01N 2033/0093 (2013.01);
Abstract
A method for determining a concentration of a synthesis component in a radiopharmaceutical sample comprises providing an indicator, a metal or a metal complex, contacting the radiopharmaceutical sample with the indicator, metal or metal complex for a period of time sufficient to obtain an interaction, measuring an optical characteristic of the interacted components, and determining a concentration of the synthesis component in the radiopharmaceutical sample based on the measured optical characteristic.