Company Badge
USPTO Data Jan 1 1976 - Oct 6 2026
13 Patents
#1 in Upper Saddle River, NJ
#896 in New Jersey
#23,815 in US
#44,988 in the World
The Texwipe Company LLC
Forward Citations = 249
20 inventors:
Upper Saddle River, NJ, United States of America
The Texwipe Company LLC
Trademarks = 3
Forward Citations = 249
Loading Chart...
Loading Chart...
20 inventors (with patents filed for the assignee):
Steven J Paley (7 out of 9 patents)
Edward Paley (5 out of 6 patents)
Peter B Russo (5 out of 6 patents)
4. Howard D Siegerman (4 out of 5 patents)
5. Jeffrey C Sayre (4 out of 4 patents)
6. Douglas W Cooper (4 out of 4 patents)
7. William R Paley (4 out of 4 patents)
8. John Skoufis (3 out of 6 patents)
9. Wayne Mazorow (3 out of 3 patents)
10. John M Questel (3 out of 3 patents)
11. Cary Africk (3 out of 3 patents)
12. Himansu R Bhattacharjee (2 out of 3 patents)
13. Barry M Scott (1 out of 7 patents)
14. Himangshu R Bhattacharjee (1 out of 10 patents)
15. Charles F Mattina (1 out of 3 patents)
13 patents:
Company Overview
The Texwipe Company LLC, based in Upper Saddle River, NJ, specializes in the development and manufacturing of contamination control products. Their offerings include cleanroom supplies, wipers, swabs, and other critical materials designed for industries such as pharmaceuticals, biotechnology, and electronics. Texwipe is committed to providing high-quality solutions that ensure cleanliness and precision in sensitive environments, supporting the rigorous standards required in these sectors.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: The Texwipe Company LLC. Retrieved from https://idiyas.com/company/texwipe-company
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]