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For the Inventor, By the Inventor

Osaka, Japan

Techno Enami Corporation


USPTO Granted Patents = 1

Forward Citations = 3

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1 inventor (with patents filed for the assignee):

goldMedal Akira Teraoka (1 out of 7 patents)


1 patent:

1. 6823040 - X-ray inspection method and apparatus used for the same (2004-11-23),
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USPTO Data Jan 1 1976 - Sep 22 2026

1 Patents

#1,654 in Osaka

#15,713 in Japan

Osaka, JP
Osaka, Japan

Techno Enami Corporation

Forward Citations = 3

1 inventor:

goldMedal Akira Teraoka (1 out of 7 patents)

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