New York, NY, United States of America

T+ink, Inc.

USPTO Granted Patents = 13

% Expired Patents = 76.9

Trademarks = 1

Forward Citations = 214

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21 inventors (with patents filed for the assignee):

goldMedal Terrance Z Kaiserman (10 out of 27 patents)

silverMedal John D Gentile (6 out of 21 patents)

bronzeMedal Keith J Margolin (4 out of 6 patents)

4.  Steven Martin Cohen (3 out of 10 patents)

5.  Daniel Lawrence (3 out of 30 patents)

6.  Anthony R Gentile (3 out of 10 patents)

7.  Daniel E Boss (2 out of 69 patents)

8.  Liang Chai (2 out of 6 patents)

9.  Scott Qualls (2 out of 2 patents)

10.  Michael Wassief (2 out of 2 patents)

11.  Juan D Bravo (2 out of 4 patents)

12.  Wilfried Hedderich (1 out of 7 patents)

13.  Andrew Ferber (1 out of 8 patents)

14.  Jeffrey R Engel (1 out of 3 patents)

15.  William W Boddie, Jr (1 out of 4 patents)


13 patents:

Company Overview
T+ink, Inc. is a technology company based in New York, specializing in the development of innovative solutions that integrate advanced sensing and communication technologies. The company focuses on creating smart, interactive products that enhance user experiences across various applications, including consumer electronics and the Internet of Things (IoT). T+ink's expertise lies in the intersection of hardware and software, enabling seamless connectivity and functionality in everyday devices.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

T+ink, Inc. USPTO Patent Assignee Logo
13 Patents

#565 in New York, NY

#1,377 in New York

#23,854 in US

#45,081 in the World

New York, NY (US)
New York, NY, United States of America
Forward Citations = 214

21 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: T+ink, Inc.. Retrieved from https://idiyas.com/company/t-plus-ink

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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