logo

For the Inventor, By the Inventor

Newark, DE, United States of America

Stf Technologies LLC


USPTO Granted Patents = 6

Forward Citations = 10

Loading Chart...
Loading Chart...

7 inventors (with patents filed for the assignee):

goldMedal Richard Dombrowski (6 out of 7 patents)

silverMedal Norman Joseph Wagner (6 out of 15 patents)

bronzeMedal Danielle Marie Witek (2 out of 10 patents)

4.  Hannah Nevel (1 out of 1 patent)

5.  Yu-Jiun Lin (1 out of 1 patent)

6.  John W Lim (1 out of 1 patent)

7.  Susana Cristina Marujo Teixeira (1 out of 1 patent)


6 patents:

1. 12699061 - High-throughput high-pressure small-angle neutron scattering sample cells and environments (2026-08-04),
2. 12552132 - Impact-resistant, damage tolerant composites with shear thickening fluid layers and uses thereof (2026-02-17),
3. 12517026 - Sample cell and support assembly for enhanced rheological measurements of soft matter and materials (2026-01-06),
4. 11926959 - High tenacity textiles containing shear thickening fluid and uses thereof (2024-03-12),
5. 10716338 - Movement-reactive athletic apparel and methods of making the same (2020-07-21),
6. 10244801 - Movement-reactive athletic apparel and methods of making the same (2019-04-02),
logo

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#43 in Newark, DE

#641 in Delaware

#44,981 in US

Newark, DE (US)
Newark, DE, United States of America

Stf Technologies LLC

Forward Citations = 10

7 inventors:

goldMedal Richard Dombrowski (6 out of 7 patents)

silverMedal Norman Joseph Wagner (6 out of 15 patents)

bronzeMedal Danielle Marie Witek (2 out of 10 patents)

4.  Hannah Nevel (1 out of 1 patent)

5.  Yu-Jiun Lin (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Stf Technologies LLC. Retrieved from https://idiyas.com/company/stf-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…