Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
9 Patents
#5 in Sandusky, OH
#1,319 in Ohio
#32,627 in US
Stein Associates, Inc.
Forward Citations = 96
14 inventors:
Sandusky, OH, United States of America
Stein Associates, Inc.
Calculating rank
Forward Citations = 96
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14 inventors (with patents filed for the assignee):
Yong Y Hwang (3 out of 6 patents)
Michael E Miller (3 out of 13 patents)
Donald A Mather (1 out of 3 patents)
4. Fred Fetzer (1 out of 3 patents)
5. Donald P Smith (1 out of 36 patents)
6. Paul Ritz (1 out of 2 patents)
7. Raymond E Booth (1 out of 7 patents)
8. James H Geary (1 out of 1 patent)
9. Thomas S Jones (1 out of 1 patent)
10. Alan B Bradley (1 out of 1 patent)
11. James W Hutchison (1 out of 1 patent)
12. Scott D Mather (1 out of 1 patent)
13. Thomas M Surmiak (1 out of 1 patent)
14. Warren Stubblebine (1 out of 1 patent)
9 patents:
Company Overview
Stein Associates, Inc. is a leading consulting firm specializing in providing strategic business solutions to clients in various industries. With over 20 years of experience, we offer expertise in areas such as market research, financial analysis, and marketing strategy. Our team of seasoned professionals is dedicated to helping businesses achieve their goals and maximize their potential for success.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Stein Associates, Inc.. Retrieved from https://idiyas.com/company/stein-associates
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]