Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
7 Patents
#16 in Middleton, WI
#868 in Wisconsin
#39,950 in US
Standard Imaging, Inc.
Forward Citations = 29
18 inventors:
Middleton, WI, United States of America
Standard Imaging, Inc.
Calculating rank
% Expired Patents = 14.3
Trademarks = 3
Forward Citations = 29
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18 inventors (with patents filed for the assignee):
Myles L Sommerfeldt (3 out of 3 patents)
Raymond Terry Riddle (2 out of 2 patents)
Neal Robert Miller (2 out of 2 patents)
4. Daniel G Schmidt (2 out of 2 patents)
5. Kevin L DeFever (2 out of 2 patents)
6. Thomas C Bonde (2 out of 2 patents)
7. John Roy Gentry (2 out of 3 patents)
8. Jacob A Gersh (1 out of 1 patent)
9. Regina K Fulkerson (1 out of 1 patent)
10. Larry DeWerd (1 out of 2 patents)
11. Bhudatt Paliwal (1 out of 8 patents)
12. Benjamin E Nelms (1 out of 7 patents)
13. Jeffrey H Manion (1 out of 1 patent)
14. Brian D Hooten (1 out of 1 patent)
15. Edward W Neumueller (1 out of 1 patent)
7 patents:
Company Overview
Standard Imaging, Inc. is a leading provider of calibration and quality assurance equipment for medical imaging and radiation therapy. With a focus on precision and accuracy, Standard Imaging delivers innovative solutions to healthcare providers worldwide. Their products ensure safety and reliability in radiation therapy and imaging procedures.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Standard Imaging, Inc.. Retrieved from https://idiyas.com/company/standard-imaging
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]