The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2011
Filed:
Aug. 18, 2009
Applicants:
Larry A. Dewerd, Madison, WI (US);
Brian D. Hooten, Middleton, WI (US);
Edward W. Neumueller, Verona, WI (US);
Inventors:
Larry A. DeWerd, Madison, WI (US);
Brian D. Hooten, Middleton, WI (US);
Edward W. Neumueller, Verona, WI (US);
Assignee:
Standard Imaging, Inc., Middleton, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/185 (2006.01);
U.S. Cl.
CPC ...
Abstract
Nested ionization chambers provide independent measurements of a radiation beam that does not fully irradiate the volume of one or both chambers. By mathematically combining these independent measurements, partial volume effects caused by a change in ionization detector calibrations when the full detector volume is not irradiated by the radiation beam, may be decreased, providing more accurate measurement of extremely small radiation beams.