EPO Patents = 3

Forward Citations = 32

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6 inventors (with patents filed for the assignee):

Jan Kocur (1 out of 3 patents)

Anthony Iorfino (1 out of 5 patents)

David Henry Gilbert (1 out of 3 patents)

4. Alastair James Veitch (1 out of 1 patent)

5. Steven J Prince (1 out of 1 patent)

6. Robert Mark Havira (1 out of 5 patents)

7. Scott Saunders (0 patent)

8. Bob Crocker (0 patent)

4 patents: Sort by Forward Citations

1. 11078631 - System and method for inspecting a rail using machine learning (2021-08-03),

2. 10836407 - System and method for inspecting a rail (2020-11-17),

3. 10168304 - Rail inspection apparatus and method (2019-01-01),

4. 9429545 - System and method for non-destructive testing of railroad rails using ultrasonic apparatuses mounted within fluid-filled tires maintained at constant temperatures (2016-08-30),

Company Overview

Sperry Rail Holdings, Inc. is a leading provider of rail inspection services and equipment. With over 80 years of experience, Sperry offers state-of-the-art technology for detecting defects on rail tracks, helping to ensure safe and efficient rail transportation. The company's solutions are used by railroads and transit systems worldwide to enhance safety and reliability in the industry.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#52 in Danbury, CT

#1,180 in Connecticut

#60,671 in US

Danbury, CT, United States of America

Sperry Rail Holdings, Inc.

Forward Citations = 32

6 inventors:

Jan Kocur (1 out of 3 patents)

Anthony Iorfino (1 out of 5 patents)

David Henry Gilbert (1 out of 3 patents)

4. Alastair James Veitch (1 out of 1 patent)

5. Steven J Prince (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sperry Rail Holdings, Inc.. Retrieved from https://idiyas.com/company/sperry-rail-holdings

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]