EPO Patents = 3

Forward Citations = 15

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4 inventors (with patents filed for the assignee):

Richard Berman (2 out of 2 patents)

David James Frederick Cooper (2 out of 2 patents)

Peter Maclean Sinclair (1 out of 1 patent)

4. John Oreopoulos (1 out of 2 patents)

4 patents: Sort by Forward Citations

1. 9500847 - Total internal reflectance fluorescence (TIRF) microscopy across multiple wavelengths simultaneously (2016-11-22),

2. 8922887 - Imaging distal end of multimode fiber (2014-12-30),

3. 8670178 - Imaging distal end of multimode fiber (2014-03-11),

4. 8275226 - Multi-mode fiber optically coupling a radiation source module to a multi-focal confocal microscope (2012-09-25),

Company Overview

Spectral Applied Research Inc. is a leading provider of innovative optical solutions for a wide range of industries. With a focus on research and development, we design and manufacture cutting-edge spectroscopic instruments and technologies to meet our clients' specific needs. Our team of experts are dedicated to delivering high-quality products and exceptional customer service to help our customers achieve their goals.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#24 in Richmond Hill

#3,466 in Canada

Richmond Hill, Canada

Spectral Applied Research Inc.

Forward Citations = 15

4 inventors:

Richard Berman (2 out of 2 patents)

David James Frederick Cooper (2 out of 2 patents)

Peter Maclean Sinclair (1 out of 1 patent)

4. John Oreopoulos (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Spectral Applied Research Inc.. Retrieved from https://idiyas.com/company/spectral-applied-research

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]