Total internal reflectance fluorescence (tirf) microscopy across multiple wavelengths simultaneously

Abstract

A multiple wavelength total internal reflection fluorescence (TIRF) microscopy system has an objective. A dispersion unit of the system comprises a high-dispersion optical element. The dispersion unit receives illumination light having at least a first wavelength λand a second wavelength λ, where λ≠λ, and splits the illumination light into a first monochromatic beam having the first wavelength λand a second monochromatic beam having the second wavelength λ. The monochromatic beams are focused onto a back focal plane of the objective, near an outer edge of the objective, at different radial distances from an optical axis of the objective. The dispersion unit is rotatable in order to adjust angles of incidence of the monochromatic beams onto an interface between a substrate and a sample to be imaged, wherein the angles of incidence are greater than the critical angle of the interface.