% Expired Patents = 80.0

EPO Patents = 4

Forward Citations = 7

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3 inventors (with patents filed for the assignee):

Jörg Rychen (5 out of 5 patents)

Dominik Ziegler (1 out of 1 patent)

Andreas Christian Stemmer (1 out of 2 patents)

5 patents: Sort by Forward Citations

1. 8950010 - Method for measuring a piezoelectric response by means of a scanning probe microscope (2015-02-03),

2. 8347411 - Scanning probe microscope and method for operating the same (2013-01-01),

3. 8296857 - Scanning probe microscope with current controlled actuator (2012-10-23),

4. 8245316 - Scanning probe microscope with periodically phase-shifted AC excitation (2012-08-14),

5. 7773009 - High resolution digital analog conversion circuit (2010-08-10),

Company Overview

Specs Zurich GmbH is a leading provider of innovative optical solutions, specializing in high-quality eyewear and optical products. Based in Zurich, the company focuses on delivering exceptional customer service and cutting-edge designs that cater to diverse consumer needs. With a commitment to sustainability and craftsmanship, Specs Zurich GmbH aims to enhance vision and style for its clients while maintaining a strong presence in the competitive eyewear market.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

5 Patents

#110 in Zurich

#1,707 in Switzerland

Zurich, Switzerland

Specs Zurich Gmbh

Forward Citations = 7

3 inventors:

Jörg Rychen (5 out of 5 patents)

Dominik Ziegler (1 out of 1 patent)

Andreas Christian Stemmer (1 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Specs Zurich Gmbh. Retrieved from https://idiyas.com/company/specs-zurich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

4 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]