Jörg Rychen

Title: Jörg Rychen: Innovator in Scanning Probe Microscopy

Introduction

Jörg Rychen is a prominent inventor based in Zurich, Switzerland. He has made significant contributions to the field of scanning probe microscopy, holding a total of 5 patents. His work focuses on enhancing the measurement techniques and sensitivity of piezoelectric responses in various materials.

Latest Patents

One of Jörg Rychen's latest patents is a method for measuring a piezoelectric response using a scanning probe microscope. This innovative method involves applying a scanning probe microscope with a probe in contact with the sample. The probe is mounted on a cantilever, and an actuator is driven by a feedback loop to oscillate at a resonance frequency. An AC voltage, closely matching this frequency, is applied to generate a piezoelectric response from the sample. A lock-in detector measures the spectral components of the control signals, allowing for high sensitivity in detecting the piezoelectric response.

Another notable patent is related to the scanning probe microscope itself, which features a primary control loop to maintain constant phase and amplitude of deflection. A secondary control loop ensures the frequency of the cantilever oscillation remains constant by applying a suitable DC voltage to the probe. This active control creates a fast system capable of quickly determining the contact potential difference or related properties of the sample.

Career Highlights

Jörg Rychen has worked with several companies, including Specs Zurich GmbH and Specs Surface Nano Analysis GmbH. His experience in these organizations has contributed to his expertise in the field of nano-analysis and microscopy.

Collaborations

Throughout his career, Jörg has collaborated with notable colleagues such as Dominik Ziegler and Andreas Christian Stemmer. These collaborations have further enriched his research and development efforts in scanning probe technology.

Conclusion

Jörg Rychen is a distinguished inventor whose work in scanning probe microscopy has advanced the understanding and measurement of piezoelectric responses. His innovative patents and collaborations reflect his commitment to pushing the boundaries of technology in this field.