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Princeton, NJ, United States of America

Siemens Corporate Research, Inc.

USPTO Granted Patents = 370

% Expired Patents = 19.2

CIPO Patents = 1

EPO Patents = 1

Forward Citations = 15,651

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287 inventors (with patents filed for the assignee):

Ming Fang (34 out of 40 patents)

Jianzhong Qian (32 out of 70 patents)

Nassir Navab (30 out of 56 patents)

4. Visvanathan Ramesh (27 out of 45 patents)

5. Dorin Comaniciu (25 out of 365 patents)

6. Frank Sauer (23 out of 70 patents)

7. Kwok C Tam (21 out of 55 patents)

8. Ali Reza Bani-Hashemi (19 out of 39 patents)

9. Justinian Rosca (15 out of 57 patents)

10. Claus Neubauer (15 out of 32 patents)

11. Guo-Qing Wei (13 out of 68 patents)

12. Peiya Liu (13 out of 16 patents)

13. Radu Victor Balan (13 out of 24 patents)

14. Amit Chakraborty (11 out of 48 patents)

15. Bernhard Geiger (11 out of 51 patents)

Core Competencies:

Medical Imaging

Augmented Reality

Machine Condition Monitoring

Image Segmentation

Object Detection

MRI Reconstruction

Video Surveillance

3D Object Detection

Pulmonary Nodule Detection

Sensor Management

Virtual Reality

Feature Detection

370 patents: Sort by Forward Citations

1. 8862484 - Method and apparatus to support evidence based medicine (2014-10-14),

2. 8320679 - Method for detecting objects using flexible edge arrangements (2012-11-27),

3. 8085043 - Method for image data acquisition with a magnetic resonance device (2011-12-27),

4. 7672987 - System and method for integration of medical information (2010-03-02),

5. 7620208 - System and method for detecting features from images of vehicles (2009-11-17),

6. 7616807 - System and method for using texture landmarks for improved markerless tracking in augmented reality applications (2009-11-10),

7. 7613638 - Automated systems and methods to support electronic business transactions for spare parts (2009-11-03),

8. 7605826 - Augmented reality guided instrument positioning with depth determining graphics (2009-10-20),

9. 7602941 - Component fusion for face detection (2009-10-13),

10. 7593547 - Video-based encroachment detection (2009-09-22),

11. 7590273 - Estimation of solitary pulmonary nodule diameters with a hybrid segmentation approach (2009-09-15),

12. 7574019 - Method for scene modeling and change detection (2009-08-11),

13. 7567878 - Evaluating anomaly for one class classifiers in machine condition monitoring (2009-07-28),

14. 7565262 - Bayesian sensor estimation for machine condition monitoring (2009-07-21),

15. 7555046 - Method and system for searching and verifying magnitude change events in video surveillance (2009-06-30),

Company Overview

Siemens Corporate Research, Inc., based in Princeton, NJ, specializes in advancing technologies within the medical imaging sector. The organization focuses on innovative solutions in areas such as augmented reality, machine condition monitoring, and image segmentation. Their expertise extends to critical applications like MRI reconstruction and video surveillance, enhancing capabilities in 3D object detection. Through its research initiatives, Siemens Corporate Research aims to drive progress in healthcare and related fields, contributing to improved diagnostic and monitoring technologies.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

370 Patents

#8 in Princeton, NJ

#65 in New Jersey

#1,241 in US

#2,492 in the World

Princeton, NJ, United States of America

Siemens Corporate Research, Inc.

Forward Citations = 15,651

287 inventors:

Ming Fang (34 out of 40 patents)

Jianzhong Qian (32 out of 70 patents)

Nassir Navab (30 out of 56 patents)

4. Visvanathan Ramesh (27 out of 45 patents)

5. Dorin Comaniciu (25 out of 365 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Siemens Corporate Research, Inc.. Retrieved from https://idiyas.com/company/siemens-corporate-research

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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