The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2012
Filed:
Mar. 21, 2008
Yan LI, Pittsburgh, PA (US);
Yanghai Tsin, Plainsboro, NJ (US);
Yakup Genc, Dayton, NJ (US);
Siemens Corporate Research, Inc., Princeton, NJ (US);
Abstract
A method wherein images of different types of objects within a class are partitioned into region stacks. For each one of the stacks, the method: (a) applies a template to extract fragments having a predetermined size and one of a plurality of different spatial orientations, to generate extracted templates; (b) determines, from the extracted templates, a most frequent one thereof having only a first number of fragments with a common spatial orientations; (c) records the number of images having the determined most frequent extracted template; (d) repeats (b) and (c) with successively increasing number of fragments until the number of recoded images falls below a threshold; and (e) selects as a master extracted template the one of the most frequent templates having the largest recorded number of fragments. The master extracted templates for the stacks are combined into a map that is then compared with background images to remove extracted templates matching segment in the background.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile